Equipments Available for Characterization

Bruker D8 "Advance" Diffractomerter equipped with the push-plug optics which enables a quick switch between the para-focusing Bragg-Brentano geometry to parallel beam geometry for grazing incidence XRD and X-ray reflectivity.  

Thermogravimetric analyzer with responsive low-mass furnace, ultra-sensitive thermobalance, and efficient horizontal purge gas system.
Other thermal analysis instruments: Differential Scanning Calorimeter and Simultaneous TG-DSC analyzer (up to 1500°C). 

Atomic Force Microscope

High-Impedance Spectroscopy system with frequency dispersion measurements from 1 MHz to 30 MHz with active guard device adapter (developed and patented) for measurement of impedances up to 1013 ohm (2 pF max). Impedance analyzer Solartron 1260, Frequency Response Analyzers (FRA) Solartron 1255 and AMEL 7200. Software for acquisition, processing and graphical representation of data in real time. 

Confocal Raman Microscope

Cryostat Leybold ROK for 4-probes DC-electrical conductivity measurements in the range 10 to 300 K

Polythermic electrochemical cells with 2 or 4 electrodes for AC or DC measurements: cell designed for low temperature with the cryostat (10-300 K); high-temperature alumina cells (20-1300 K)

System for the annealing and for the electrical characterization of ceramic samples, consisting of a flow apparatus for the control and measurement of the oxygen partial pressure (pO2), with mass flow controllers, sensors and electrochemical oxygen pumps (in the field from 1 down to 10-20 atm pO2).

Equipments Available for Materials Preparation 

Several Furnaces operating until 1700°C in vacuum or controlled atmosphere. 

RF Magnetron Sputtering deposition of thin films of oxides, assisted by radio frequency, in inert (Ar) or partially reactive (Ar/O2) atmosphere equpped with 3 cathodes and infrared substrate heater.

Dry-box with high performances (<1 ppm O2 and H2O) 

Uniaxial press and isostatic press up to 3000 bar with oil bath.